扫描电镜
材料科学
显微镜
光学显微镜
光学
液晶
共焦显微镜
超分辨显微术
显微镜
偏振光显微镜
分辨率(逻辑)
荧光显微镜
共焦
受激发射
薄层荧光显微镜
光电子学
扫描共焦电子显微镜
荧光
扫描电子显微镜
激光器
物理
复合材料
人工智能
计算机科学
作者
Jaka Pišljar,Gregor Posnjak,Stane Pajk,Andrej Godec,Rok Podlipec,Boštjan Kokot,Igor Muševič
出处
期刊:Liquid Crystals
[Taylor & Francis]
日期:2020-01-08
卷期号:47 (9): 1303-1311
被引量:3
标识
DOI:10.1080/02678292.2019.1710870
摘要
The goal of this work is to compare experimentally achievable resolution limits of three different optical microscopy techniques in chiral nematic liquid crystals: (i) standard optical polarisation microscopy, (ii) confocal optical microscopy using fluorescently labelled liquid crystal and (iii) Stimulated Emission Depletion (STED) microscopy using custom synthesised fluorescent dyes. The microscopy experiments on micrometre thin LC samples reveal that the lateral resolution better than ~90 nm can be achieved using STED technique in thin layers of liquid crystals. The standard optical microscopy with index matching between the objective and the sample cover glass in combination with short-wavelength narrow-band optical illumination is quite competitive to STED technique and optical details as small as ~150 nm could be resolved using aberration limited microscope.
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