材料科学
热膨胀
氮化硼
范德瓦尔斯力
拉曼光谱
技术
单层
薄膜
密度泛函理论
分析化学(期刊)
复合材料
凝聚态物理
纳米技术
计算化学
化学
光学
物理
色谱法
电离层
分子
有机化学
天文
作者
Qiran Cai,Eli Janzen,James H. Edgar,Wei Gan,Shunying Zhang,Elton J. G. Santos,Lu Hua Li
出处
期刊:2D materials
[IOP Publishing]
日期:2021-06-02
卷期号:8 (3): 034006-034006
被引量:8
标识
DOI:10.1088/2053-1583/ac0730
摘要
Atomically thin monoisotopic boron nitride (BN) which is electrically insulating and has a high thermal conductivity could be utilized as fillers in electronic packaging materials for thermal dissipation in integrated and miniaturized modern devices.Thermal expansion mismatch in electronic packaging could cause strain and ultimately device failure, so it is valuable to measure and understand the thermal expansion coefficient (TEC) of atomically thin isotopically pure BN.In this work, we studied the TECs of mono-, bi-, and tri-layer isotope-purified BN using Raman spectroscopy and density functional theory (DFT) calculations including van der Waals dispersion forces.Monolayer (1L) 10 BN had a slightly larger experimental TEC than 1L 11 BN at close to room temperature: (-5.1±0.8)×10 - /K and (-4.6±0.8)×10 - /K, respectively.The negative TECs up to 700K were attributed to the competition between the in-plane stretching vibration modes and out-of-plane bending modes in BN; the lighter isotope leads to a larger absolute TEC due to higher amplitude of its out-of-plane bending modes.The absolute TECs of isotopic BN decreased with increased atomic thickness, which indicates strengthening of the out-of-plane bending rigidity.The deep understanding of the isotope effect on the TEC of two-dimensional materials also opens a promising pathway to minimize TEC mismatch in two-dimensional van der Waals heterostructures.
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