Hydrogen injection and retention in nanocavities of single-crystalline silicon
硅
氢
晶体硅
材料科学
化学
纳米技术
光电子学
化学工程
有机化学
工程类
作者
G. F. Cerofolini,E. Romano,Dario Narducci,Federico Corni,Stefano Frabboni,G. Ottaviani,R. Tonini
出处
期刊:Journal of Physics D [IOP Publishing] 日期:2009-02-25卷期号:42 (6): 062001-062001被引量:7
标识
DOI:10.1088/0022-3727/42/6/062001
摘要
The control of the chemical state of the inner surfaces of nanocavities (NCs) produced by the annealing of helium-implanted silicon has influence on lifetime control, gettering and wafer bonding. In this work it is demonstrated that the etching in HFaq of (1 0 0) silicon containing a buried array of NCs produces a giant injection of hydrogen with the consequent passivation of the inner surfaces, mainly via the formation of silicon monohydride at (1 1 1) faces and monohydride dimers at 2 × 1 reconstructed (1 0 0) faces. These terminations are very stable and survive heat treatments at 700 °C.