半导体
兴奋剂
密度泛函理论
肖特基势垒
材料科学
厚板
代表(政治)
电荷(物理)
肖特基二极管
统计物理学
计算机科学
光电子学
电子工程
计算化学
物理
化学
量子力学
工程类
地球物理学
政治学
法学
政治
二极管
作者
Daniele Stradi,Umberto Martinez,Anders Blom,Mads Brandbyge,Kurt Stokbro
标识
DOI:10.1109/nano.2016.7751401
摘要
We present a general framework for simulating interfaces using an atomistic approach based on density functional theory and non-equilibrium Green's functions. The method includes all the relevant ingredients, such as doping and an accurate value of the semiconductor band gap, required to model realistic metal-semiconductor interfaces and allows for a direct comparison between theory and experiments via the I-V curve. In particular, it will be demonstrated how doping - and bias - modifies the Schottky barrier, and how finite size models (the slab approach) are unable to describe these interfaces properly due to a poor representation of space-charge effects.
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