埃
电解质
电极
电荷密度
仿形(计算机编程)
化学物理
材料科学
分析化学(期刊)
空间电荷
分辨率(逻辑)
纳米技术
光电子学
化学
计算机科学
物理
结晶学
物理化学
操作系统
人工智能
电子
量子力学
色谱法
作者
Lalith Krishna Samanth Bonagiri,Kaustubh S. Panse,Shan Zhou,Haiyi Wu,N. R. Aluru,Yingjie Zhang
出处
期刊:ACS Nano
[American Chemical Society]
日期:2022-11-09
卷期号:16 (11): 19594-19604
被引量:22
标识
DOI:10.1021/acsnano.2c10819
摘要
The accumulation and depletion of charges at electrode-electrolyte interfaces is crucial for all types of electrochemical processes. However, the spatial profile of such interfacial charges remains largely elusive. Here we develop charge profiling three-dimensional (3D) atomic force microscopy (CP-3D-AFM) to experimentally quantify the real-space charge distribution of the electrode surface and electric double layers (EDLs) with angstrom depth resolution. We first measure the 3D force maps at different electrode potentials using our recently developed electrochemical 3D-AFM. Through statistical analysis, peak deconvolution, and electrostatic calculations, we derive the depth profile of the local charge density. We perform such charge profiling for two types of emergent electrolytes, ionic liquids, and highly concentrated aqueous solutions, observe pronounced sub-nanometer charge variations, and find the integrated charge densities to agree with those derived from macroscopic electrochemical measurements.
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