微晶玻璃
故障注入
嵌入式系统
可靠性(半导体)
现场可编程门阵列
断层(地质)
软错误
软件部署
故障率
实时操作系统
计算机科学
空间环境
可靠性工程
工程类
软件
操作系统
电子工程
功率(物理)
地震学
地质学
物理
量子力学
地球物理学
作者
Andrea Portaluri,Sarah Azimi,Corrado De Sio,Daniele Rizzieri,Luca Sterpone
标识
DOI:10.1007/978-3-031-21867-5_12
摘要
The interest of the space industry in Real-Time Operating Systems for achieving stringent real-time requirement is drastically increasing. Among the different available hardware architectures, the solution of RTOS implemented on soft processors embedded in programmable devices is one of the most efficient and flexible solution for the mission deployment. However, radiation-induced failures are a severe concern affecting the reliability of electronic systems in space applications. In this paper, we investigate the impact of radiation-induced architectural faults affecting the reliability of application running on a Xilinx Microblaze embedded soft-processor within FreeRTOS Operating System. We developed a fault model through a proton radiation test, while the effects of the faults are evaluated in terms of Mean Time To Failure and Mean Executions To Failure, by a fault injection campaign using detected fault models. Finally, the occurrence and contribution to the error rate of specific MBUs events based on different shapes and sizes are evaluated through dedicated fault injection campaigns.
科研通智能强力驱动
Strongly Powered by AbleSci AI