电压
电容
导电体
静电放电
电气工程
电荷
电位
电荷(物理)
高压
物理
光电子学
材料科学
工程类
电极
量子力学
出处
期刊:Electrical Overstress/Electrostatic Discharge Symposium
日期:1996-09-10
被引量:10
标识
DOI:10.1109/eosesd.1996.865126
摘要
It is well known that devices laying on the ground plane of CDM testers are more susceptible to CDM damage because their capacitances are increased quantities of electric charge are also increased. But real-life CDM events in the environment are opposite to tendencies of CDM tests. In real-life, charging of devices occurs by friction or static induction and capacitances of devices don't influence quantities of electric charge on devices. And the capacitance influences voltage of gap between pins of devices and conductive materials, the voltage become lower when devices are laying on any conductive material because quantities of electric charge of Q until discharge are constant and electric potentials of V derived from equation V=Q/C are variable. Thus we researched high voltage CDM discharges on small capacitances to perform right CDM test because capacitances of inclining position of devices become smaller and their voltages become over 1000 V. Then we found out new phenomena on high voltage aerial discharges.
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