钒
退火(玻璃)
氧化钒
氧化物
材料科学
外延
金属
价
结晶学
低能电子衍射
扫描隧道显微镜
氧气
图层(电子)
电子衍射
分析化学(期刊)
化学
冶金
衍射
纳米技术
光学
物理
哲学
有机化学
色谱法
语言学
作者
H. Niehus,Ralf‐Peter Blum,Dirk Ahlbehrendt
标识
DOI:10.1142/s0218625x03004962
摘要
The epitaxial growth of vanadium oxide (V 2 O 3 ) has been investigated by scanning tunneling microscopy (STM), low energy ion back-scattering (ISS) and low energy electron diffraction (LEED). Direct evaporation of vanadium onto metal surfaces (Cu, Au or Cu 3 Au) gives rise to massive surface alloying. The attempt to oxidize the vanadium film by consequent oxygen exposure leads to the formation of rough VO x films of poor quality and mixed valency. A new way of oxide formation has been developed by preoxidation of a Cu 3 Au substrate, which acts positively in two ways since it prevents completely alloy formation and also forces strong surface wetting of the vanadium oxide. As a result, two-dimensional layer growth of good quality has been achieved. Depending on the preoxygen content at Cu 3 Au(100), the amount of V deposition and annealing temperature, different epitaxial layers of vanadium oxides can be prepared. In particular, the surface structure of V 2 O 3 (0001) was investigated. The surface structure appears completely different from the half layer metal termination at Cr 2 O 3 (0001). Specifically, the full vanadium layer stabilized by one third of an oxygen layer located in pseudo bridge positions close to regular oxygen positions of a next layer. Close to defects the full vanadium layer appears also without oxygen stabilization.
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