神经形态工程学
记忆电阻器
计算机科学
电阻随机存取存储器
尖峰神经网络
架空(工程)
人工神经网络
推论
工艺变化
专用集成电路
校准
过程(计算)
人工智能
电子工程
计算机硬件
电压
工程类
数学
电气工程
统计
操作系统
作者
Chi Tung,Kuan-Wei Hou,Cheng‐Wen Wu
标识
DOI:10.1109/vlsi-tsa/vlsi-dat57221.2023.10134261
摘要
The memristor-based neuromorphic computing architectures, which are based on the resistive random-access memory (RRAM) cell array, have been widely investigated recently. They are used for implementing both the deep neural network (DNN) and spiking neural network (SNN) models, trying to achieve better energy efficiency in AI computing. In the memristor-based SNNs, the synaptic weights are normally implemented by a memristor cell array, and the neurons are mainly analog circuits. Since the memristors and analog circuits are sensitive to variation in process parameters, the inference accuracy of the SNNs can degrade due to process variation, even for the SNNs that pass the production test. In this paper, we first investigate the impact of process variation on the SNNs, such as the memristor resistance variation and device parameter variation. We then propose a calibration scheme that can effectively recover the inference accuracy, given process variation in the specified range. Also, we develop a built-in self-calibration (BISC) architecture based on an SNN chip that we have designed. Experimental results show that the inference accuracy of the SNN ASIC can be improved by up to 76.8%, with only 1% silicon area overhead.
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