材料科学
薄膜
无定形固体
微晶
拉曼光谱
结晶度
蒸发
正交晶系
硫系化合物
分析化学(期刊)
衍射
复合材料
光学
结晶学
纳米技术
光电子学
冶金
物理
热力学
化学
色谱法
作者
C. Vijayan,M. Pandiaraman,N. Soundararajan,R. Chandramohan,Shivaraman Ramaswamy
标识
DOI:10.1179/1743294414y.0000000353
摘要
Semiconducting silver selenide telluride (Ag 2 SeTe) ternary thin films of different thicknesses were synthesised employing thermal evaporation. The variation in structure of the films with thickness was estimated using X-ray diffraction studies. The thin films of lower thickness were amorphous, and at higher thickness, they were polycrystalline in nature with orthorhombic structure. The film crystallinity increased with increase in thickness. Increase in thickness beyond 320 nm caused the appearance of new peaks with increased intensity. The structural studies on typical Ag 2 Se 0·2 Te 0·8 system revealed that the stoichiometry of the bulk corresponded to that of the thin films. Micro-Raman spectra of the Ag 2 Se 0·2 Te 0·8 thin films were recorded and analysed. The optical image of Ag 2 Se 0·2 Te 0·8 thin films was also studied. The topography of the thin film was studied using atomic force microscopy. The results are presented.
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