材料科学
外延
焦绿石
单斜晶系
铁电性
正交晶系
氧化物
薄膜
立方氧化锆
结晶学
相(物质)
分析化学(期刊)
光电子学
晶体结构
纳米技术
图层(电子)
陶瓷
电介质
复合材料
化学
冶金
有机化学
色谱法
作者
Zimeng Zhang,Su‐Ting Hsu,Vladimir Stoica,Hanjong Paik,Eric Parsonnet,Alexander Qualls,Jianjun Wang,Liang Xie,Mala Kumari,Sujit Das,Zhinan Leng,Martin E. McBriarty,Roger Proksch,Alexei Gruverman,Darrell G. Schlom,Lei Chen,Sayeef Salahuddin,Lane W. Martin,R. Ramesh
标识
DOI:10.1002/adma.202006089
摘要
Abstract The synthesis of fully epitaxial ferroelectric Hf 0.5 Zr 0.5 O 2 (HZO) thin films through the use of a conducting pyrochlore oxide electrode that acts as a structural and chemical template is reported. Such pyrochlores, exemplified by Pb 2 Ir 2 O 7 (PIO) and Bi 2 Ru 2 O 7 (BRO), exhibit metallic conductivity with room‐temperature resistivity of <1 mΩ cm and are closely lattice matched to yttria‐stabilized zirconia substrates as well as the HZO layers grown on top of them. Evidence for epitaxy and domain formation is established with X‐ray diffraction and scanning transmission electron microscopy, which show that the c ‐axis of the HZO film is normal to the substrate surface. The emergence of the non‐polar‐monoclinic phase from the polar‐orthorhombic phase is observed when the HZO film thickness is ≥≈30 nm. Thermodynamic analyses reveal the role of epitaxial strain and surface energy in stabilizing the polar phase as well as its coexistence with the non‐polar‐monoclinic phase as a function of film thickness.
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