P‐101: Degradation Analysis of OLED Panels by Laser Desorption/Ionization Time‐of‐Flight Mass Spectrometry with Fine‐Focused Imaging System

Degradation of the organic light‐emitting diode (OLED) panels was analyzed utilizing laser desorption/ionization time‐of‐flight mass spectrometry (LDI‐TOF‐MS). 349‐nm‐long UV laser with beam diameter of 5 µm was directly irradiated on the OLED panels to evaluate the change of mass spectra after thermal degradation. The mass to charge ratio was visualized by utilizing our imaging system with measurement speed of 30 µm 2 /s. The imaging technique helps us intuitively understand the change of material properties with area dependence on the panels.