材料科学
铁电性
压电
电介质
微观结构
薄膜
钙钛矿(结构)
凝聚态物理
泄漏(经济)
电极
工程物理
复合材料
光电子学
纳米技术
结晶学
物理化学
工程类
物理
宏观经济学
经济
化学
作者
T. M. Shaw,Susan Trolier‐McKinstry,Paul C. McIntyre
出处
期刊:Annual Review of Materials Science
[Annual Reviews]
日期:2000-08-01
卷期号:30 (1): 263-298
被引量:494
标识
DOI:10.1146/annurev.matsci.30.1.263
摘要
▪ Abstract This paper reviews the literature on size effects in ferroelectric materials, with an emphasis on thin film perovskite ferroelectrics. The roles of boundary conditions, defect chemistry, electrode interfaces, surface layers, and microstructure in controlling the measured properties of ferroelectric films, as well as the observed deviation from bulk properties are discussed. Examples of the manifestation of size effects in terms of the low and high field dielectric properties, the piezoelectric effect, and the leakage behavior of films are given.
科研通智能强力驱动
Strongly Powered by AbleSci AI