电子能量损失谱
等离子体子
铜
扫描透射电子显微镜
材料科学
光谱学
化学物理
化学种类
价(化学)
电子
透射电子显微镜
原位
价电子
分子物理学
分析化学(期刊)
原子物理学
纳米技术
化学
光电子学
物理
量子力学
有机化学
冶金
色谱法
作者
Megan E. Holtz,Yingchao Yu,Jie Gao,Héctor D. Abruña,David A. Muller
标识
DOI:10.1017/s1431927613001505
摘要
In situ scanning transmission electron microscopy (STEM) through liquids is a promising approach for exploring biological and materials processes. However, options for in situ chemical identification are limited: X-ray analysis is precluded because the liquid cell holder shadows the detector, and electron energy-loss spectroscopy (EELS) is degraded by multiple scattering events in thick layers. Here, we explore the limits of EELS for studying chemical reactions in their native environments in real time and on the nanometer scale. The determination of the local electron density, optical gap and thickness of the liquid layer by valence EELS is demonstrated. By comparing theoretical and experimental plasmon energies, we find that liquids appear to follow the free-electron model that has been previously established for solids. Signals at energies below the optical gap and plasmon energy of the liquid provide a high signal-to-background ratio regime as demonstrated for LiFePO4 in aqueous solution. The potential for using valence EELS to understand in situ STEM reactions is demonstrated for beam-induced deposition of metallic copper: as copper clusters grow, EELS develops low-loss peaks corresponding to metallic copper. From these techniques, in situ imaging and valence EELS offer insight into the local electronic structure of nanoparticles and chemical reactions.
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