Insertion loss study for panel-level single-mode glass waveguides

The paper compares the results of panel- and wafer-level processing of display glass integrated single mode optical waveguides. The comparison is based on measurements of the same optical structures processed using panel- and waferlevel technology. Additionally, large panels of 440 mm x 305 mm where manufactured to prove the scalability of the single-mode process. Measurements are done by optical back scattering reflectometry using a Luna OBR 4600 and a fiber-based propagation loss measurement setup. Based on these results of diverse processing equipment and substrate dimensions, a comprehensive statistic is shown and error estimation made to compare the different technologies.