激发
从头算
材料科学
硅
热的
熔化温度
密度泛函理论
激光器
衍射
半导体
熔点
分子物理学
热力学
化学
计算化学
物理
光学
有机化学
冶金
复合材料
量子力学
光电子学
作者
Chao Lian,Shengbai Zhang,Sheng Meng
出处
期刊:Physical review
日期:2016-11-28
卷期号:94 (18)
被引量:39
标识
DOI:10.1103/physrevb.94.184310
摘要
Laser melting of semiconductors has been observed for almost 40 years; surprisingly, it is not well understood where most theoretical simulations show a laser-induced thermal process. $\textit{Ab initio}$ nonadiabatic simulations based on real-time time-dependent density functional theory reveal intrinsic nonthermal melting of silicon, at a temperature far below the thermal melting temperature of 1680 K. Both excitation threshold and time evolution of diffraction intensity agree well with experiment. Nonthermal melting is attributed to excitation-induced drastic changes in bonding electron density, and the subsequent decrease in the melting barrier, rather than lattice heating as previously assumed in the two-temperature models.
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