钝化
氧化铈
材料科学
电介质
兴奋剂
铈
氧化物
硅
纳米结构
半导体
高-κ电介质
纳米技术
化学工程
无机化学
光电子学
冶金
图层(电子)
化学
工程类
作者
Saad Milad Ali Nsar,Z. Hassan,Kuan Yew Cheong,Way Foong Lim
标识
DOI:10.1088/2053-1591/ad52ef
摘要
Abstract In this review, an introduction to nanostructured films focusing on cerium oxide (CeO 2 ) as high dielectric constant ( k ) material for silicon-based metal-oxide-semiconductor devices, and subsequently background of using low k silicon dioxide as well as the transition to high k materials was presented. Moreover, the properties of CeO 2 in general and the applications of CeO 2 and doped CeO 2 films as high k passivation layers were reviewed. The beneficial effect of using CeO 2 seed layers on the characteristics of CeO 2 nanostructures was discussed. Moreover, challenges faced by CeO 2 and the potential of doping trivalent cations into the CeO 2 lattice for enhancement of passivation properties were thoroughly discussed.
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