Using ESEM and SEM to compare the performance of dentin conditioners

Abstract A comparison of four dentinal conditioners was performed utilizing a traditional scanning electron microscope (SEM) and a new technology, the ElectroScan™ environmental scanning electron microscope (ESEM). Both ESEM and SEM analysis verified current theorized mechanisms of adhesion to dentin surfaces. ESEM images appeared to more closely approximate what one would expect cut and treated dentin surfaces look like. Increases in information from the “surfaces” of uncoated specimens and the reduction in specimen preparation time were associated with ESEM analysis. © 1993 Wiley‐Liss, Inc.