Sub-ångström transmission microscopy: A fourier transform algorithm for microdiffraction plane intensity information

It is shown that in the limit of a thin specimen, it is possible to transform all the intensity information available in the microdiffraction plane of a scanning transmission electron microscope (STEM) to obtain the complex specimen function at wavelength-limited resolution. The algorithm, which processes all microdiffraction data as a function of probe position, requires the use of only fast Fourier transforms.