材料科学
扫描电子显微镜
表面粗糙度
样品(材料)
曲面(拓扑)
表面光洁度
直接成像
光学
复合材料
几何学
物理
热力学
数学
作者
Renaud Podor,X.F. Le Goff,Joseph Lautru,Henri‐Pierre Brau,M. Barreau,Xavier Carrier,Jérôme Mendonça,Dorian Nogues,Antoine Candeias
标识
DOI:10.1017/s1431927620001348
摘要
High-temperature scanning electron microscopy allows the direct study of the temperature behavior of materials. Using a newly developed heating stage, tilted images series were recorded at high temperature and 3D images of the sample surface were reconstructed. By combining 3D images recorded at different temperatures, the variations of material roughness can be accurately described and associated with local changes in the topography of the sample surface.
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