余辉
热释光
荧光粉
持续发光
发光
俘获
材料科学
光电子学
物理
天体物理学
生物
生态学
伽马射线暴
作者
David Van der Heggen,Dimitri Vandenberghe,Nasrin Karimi Moayed,Johan De Grave,Philippe F. Smet,Jonas Joos
标识
DOI:10.1016/j.jlumin.2020.117496
摘要
Although the luminescence characteristics of persistent phosphors have been extensively investigated, the physical mechanism underlying their afterglow is not yet fully understood. Many variables influence the outcome of thermoluminescence, charging and afterglow experiments, hampering a correct interpretation. Here we investigate the role of deep, thermally stable traps in SrAl2O4:Eu2+,Dy3+ which received little attention in previous studies. We demonstrate that these traps have a considerably higher trapping cross-section than the shallow traps, which are responsible for the persistent luminescence. This affects the charging dynamics of the shallow traps significantly and should therefore be considered in behavioral studies of these phosphors.
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