Raman scattering and photoluminescence in In+ and As+ ion-implanted SiO2 layers encapsulated with Si3N4

Raman and photoluminescence spectra were investigated in the In+ and As+ ion-implanted SiO2 films encapsulated with Si3N4 layers as a function of annealing temperature. The optical phonon frequency, as a function of the InAs nanocrystal size, was also calculated within the confined phonon model. The Raman scattering band of around 231 cm−1, close to the low-frequency shifted longitudinal optical phonon mode in the InAs matrix, was observed as the annealing temperature increased to 900 °C. The InAs nanocrystal size of 3 nm was estimated. The strong room-temperature photoluminescence peaking at 550 nm (2.25 eV) was also obtained under the 473 nm wavelength excitation. Its intensity reached a maximum value as the annealing temperature increased to 1000 °C. Its peak position was blue-shifted as the excitation wavelength decreased. The direct irradiative electron and hole recombination in the InAs nanocrystals was proposed as a possible mechanism of this photoluminescence.