材料科学
电子束光刻
纳米技术
反应离子刻蚀
平版印刷术
纳米光刻
薄脆饼
蚀刻(微加工)
抵抗
纳米材料
光电子学
下一代光刻
模版印刷
病理
制作
医学
替代医学
图层(电子)
作者
Xiaohan Wang,Xiao Dai,Hao Wang,Jiong Wang,Qi Chen,Fengnan Chen,Qinghua Yi,Rujun Tang,Liang Gao,Liang Ma,Chen Wang,Xiangyi Wang,Guanglong He,Yue Fei,Yanqiu Guan,Biao Zhang,Yue Dai,Xuecou Tu,Lijian Zhang,Labao Zhang,Guifu Zou
出处
期刊:ACS Nano
[American Chemical Society]
日期:2023-02-20
卷期号:17 (5): 4933-4941
被引量:9
标识
DOI:10.1021/acsnano.2c12387
摘要
Electron beam lithography uses an accelerated electron beam to fabricate patterning on an electron-beam-sensitive resist but requires complex dry etching or lift-off processes to transfer the pattern to the substrate or film on the substrate. In this study, etching-free electron beam lithography is developed to directly write a pattern of various materials in all-water processes, achieving the desired semiconductor nanopatterns on a silicon wafer. Introduced sugars are copolymerized with metal ions-coordinated polyethylenimine under the action of electron beams. The all-water process and thermal treatment result in nanomaterials with satisfactory electronic properties, indicating that diverse on-chip semiconductors (e.g., metal oxides, sulfides, and nitrides) can be directly printed on-chip by an aqueous solution system. As a demonstration, zinc oxide patterns can be achieved with a line width of 18 nm and a mobility of 3.94 cm2 V–1 s–1. This etching-free electron beam lithography strategy provides an efficient alternative for micro/nanofabrication and chip manufacturing.
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