Hybrid TLM-CTLM Test Structure for Determining Specific Contact Resistivity of Ohmic Contacts

Various test structures can be used to determine the specific contact resistivity of ohmic contacts.The transmission line model test structure and circular transmission line model test structure are the most commonly used.The analytical expressions of the former are straightforward and effectively describe the electrical behavior of a contact, while the concentric geometry of the latter eliminates complications during fabrication.In this paper, we present a hybrid test structure that combines the advantages of the transmission line and the circular transmission line models.The analytical expressions of the new structure are presented, and its finite-element modeling is undertaken.The effect of contact geometry on this test structure is also discussed.Using the presented test structure, determining contact parameters does not require any error corrections.