Reliability Assessment for Dual Constant‐Stress Accelerated Life Test Based on Weibull Distribution With Type‐II Censoring

ABSTRACT Accelerated life test (ALT) is a generally feasible and effective approach for evaluating the reliability of highly reliable products at normal operating conditions. This paper considers the reliability assessment for a dual constant‐stress ALT with Type‐II censoring for the Weibull distribution with constant shape parameter and a log‐linear link between the scale parameter and the stress factors. We derive the maximum likelihood estimates, weighted least squares estimates using a certain random variable transformation, and a combined maximum likelihood‐least squares estimates for the unknown parameters. In addition, we construct confidence intervals for the parameters of interest using both asymptotic theory and parametric bootstrap technique. Finally, simulation studies and an illustrative example are presented to demonstrate the effectiveness and feasibility of the proposed methods.