插入损耗
高电子迁移率晶体管
回波损耗
线性
电感器
材料科学
电气工程
光电子学
电压
晶体管
工程类
天线(收音机)
作者
Jae-Hyun Kwon,Jinho Yoo,Jae Yong Lee,Taehun Kim,Changkun Park
标识
DOI:10.1109/wamicon57636.2023.10124891
摘要
This paper presents a sub-6 GHz dual-gate single-pole double-throw (SPDT) switch fabricated in a 0.5 μm GaAs pHEMT technology. All ports are matched by a single inductor which allows to achieve low insertion loss and high isolation in the operating frequency range of 3–5 GHz. Dual-gate technique and OFF-state voltage optimization were used to enhance linearity while reducing the insertion loss. The input and output return losses measured at 3–5 GHz were > 15 dB. The insertion loss was measured < 0.3 dB and isolation was > 32.7 dB at 3–5 GHz. At 3 GHz, the measurement result of the input 1-dB compression point (IP 1dB ) was higher than 34.2 dBm. The chip area of the proposed SPDT switch, including pads, is 0.97 × 0.86 mm 2 .
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