跨导
材料科学
场效应晶体管
光电子学
检出限
晶体管
纳米线
基质(水族馆)
阈下传导
硅纳米线
阈下斜率
灵敏度(控制系统)
噪音(视频)
硅
联轴节(管道)
生物传感器
纳米技术
化学
电子工程
电气工程
电压
工程类
人工智能
地质学
冶金
图像(数学)
海洋学
色谱法
计算机科学
作者
Sergii Pud,Jing Li,Volodymyr Sibiliev,Mykhaylo Petrychuk,V. F. Kovalenko,Andreas Offenhäusser,S. А. Vitusevich
出处
期刊:Nano Letters
[American Chemical Society]
日期:2014-01-06
卷期号:14 (2): 578-584
被引量:44
摘要
We employ noise spectroscopy and transconductance measurements to establish the optimal regimes of operation for our fabricated silicon nanowire field-effect transistors (Si NW FETs) sensors. A strong coupling between the liquid gate and back gate (the substrate) has been revealed and used for optimisation of signal-to-noise ratio in sub-threshold as well as above-threshold regimes. Increasing the sensitivity of Si NW FET sensors above the detection limit has been predicted and proven by direct experimental measurements.
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