光学
显微镜
光学相干层析成像
散射
材料科学
光散射
共焦显微镜
光学显微镜
穿透深度
分辨率(逻辑)
薄层荧光显微镜
光学现象
扫描共焦电子显微镜
物理
人工智能
扫描电子显微镜
计算机科学
作者
Amaury Badon,Albert‐Claude Boccara,Geoffroy Lerosey,Mathias Fink,Alexandre Aubry
出处
期刊:Optics Express
[Optica Publishing Group]
日期:2017-11-07
卷期号:25 (23): 28914-28914
被引量:42
摘要
Optical microscopy offers a unique insight of biological structures with a sub-micrometer resolution and a minimum invasiveness. However, the inhomogeneities of the specimen itself can induce multiple scattering of light and optical aberrations which limit the observation to depths close to the surface. To predict quantitatively the penetration depth in microscopy, we theoretically derive the single-to-multiple scattering ratio in reflection. From this key quantity, the multiple scattering limit is deduced for various microscopic imaging techniques such as confocal microscopy, optical coherence tomography and related methods.
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