纳米金刚石
钻石
材料科学
纳米尺度
透射电子显微镜
表征(材料科学)
外延
高分辨率透射电子显微镜
原位
纳米技术
化学
复合材料
有机化学
图层(电子)
出处
期刊:Semiconductors and Semimetals
日期:2021-01-01
卷期号:: 31-104
被引量:3
标识
DOI:10.1016/bs.semsem.2020.08.003
摘要
The imaging, diffraction and spectroscopy methods of advanced and in situ transmission electron microscopy (TEM) provide high-resolution characterization of structure, defects, interfaces and surface phenomena and observations of materials reactions on a microscopic and nanoscopic scale, thus being key to the understanding of materials properties. This article illustrates the potential of these methods for the materials science of diamond and for the development of its applications in device technology. Selected contributions to the different topical fields of epitaxial CVD synthesis of diamond, nanodiamond, defects, physical properties, and device technology are reviewed.
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