Xuchen Zhang,Xuefei Han,Thomas E. Sarvey,Craig E. Green,Peter A. Kottke,Andrei G. Fedorov,Yogendra Joshi,Muhannad S. Bakir
出处
期刊:Journal of Electronic Packaging [ASME International] 日期:2016-01-18卷期号:138 (1)被引量:18
标识
DOI:10.1115/1.4032496
摘要
This paper reports on novel thermal testbeds with embedded micropin-fin heat sinks that were designed and microfabricated in silicon. Two micropin-fin arrays were presented, each with a nominal pin height of 200 μm and pin diameters of 90 μm and 30 μm. Single-phase and two-phase thermal testing of the micropin-fin array heat sinks were performed using de-ionized (DI) water as the coolant. The tested mass flow rate was 0.001 kg/s, and heat flux ranged from 30 W/cm2 to 470 W/cm2. The maximum heat transfer coefficient reached was 60 kW/m2 K. The results obtained from the two testbeds were compared and analyzed, showing that density of the micropin-fins has a significant impact on thermal performance. The convective thermal resistance in the single-phase region was calculated and fitted to an empirical model. The model was then used to explore the tradeoff between the electrical and thermal performance in heat sink design.