同质结
异质结
材料科学
欧姆接触
半导体
半导体器件
接触电阻
光电子学
工程物理
纳米技术
物理
图层(电子)
作者
Junhao Ni,Quangui Fu,Kostya Ostrikov,Xiaofeng Gu,Haiyan Nan,Shaoqing Xiao
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2021-10-17
卷期号:33 (6): 062005-062005
被引量:10
标识
DOI:10.1088/1361-6528/ac2fe1
摘要
In recent years, two-dimensional materials have received more and more attention in the development of semiconductor devices, and their practical applications in optoelectronic devices have also developed rapidly. However, there are still some factors that limit the performance of two-dimensional semiconductor material devices, and one of the most important is Ohmic contact. Here, we elaborate on a variety of approaches to achieve Ohmic contacts on two dimensional materials and reveal their physical mechanisms. For the work function mismatch problem, we summarize the comparison of barrier heights between different metals and 2D semiconductors. We also examine different methods to solve the problem of Fermi level pinning. For the novel 2D metal-semiconductor contact methods, we analyze their effects on reducing contact resistance from two different perspectives: homojunction and heterojunction. Finally, the challenges of 2D semiconductors in achieving Ohmic contacts are outlined.
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