无杂散动态范围
逐次逼近ADC
比较器
电容器
电子工程
CMOS芯片
校准
积分非线性
计算机科学
工程类
电气工程
转换器
物理
电压
量子力学
作者
Hwan-Seok Ku,Seungnam Choi,Jae‐Yoon Sim
标识
DOI:10.5573/jsts.2021.21.2.143
摘要
This paper presents an asynchronous-clocking 16-bit successive approximation register (SAR) analog-to-digital converter (ADC) suitable for high-precision sensor applications. Comparator noise and nonlinearity from capacitor mismatch, as two major performance-limiting problems of SAR ADC, are resolved by noise averaging with a residue integration and a digital-domain capacitor error calibration, respectively. The proposed ADC is implemented using 180-nm CMOS technology in an area of 0.68㎟. The calibration improves SNDR by 5.9 dB and SFDR by 14.3 dB, achieving an SNDR of 87.5 dB and an SFDR of 106.85 dB, respectively.
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