Shear strength and fracture mechanism for full Cu-Sn IMCs solder joints with different Cu3Sn proportion and joints with conventional interfacial structure in electronic packaging

焊接 材料科学 接头(建筑物) 抗剪强度(土壤) 复合材料 断裂(地质) 劈理(地质) 剪切(地质) 直剪试验 冶金 结构工程 环境科学 工程类 土壤科学 土壤水分
作者
Peng Yao,Xiao-yan Li,Xu Han,Liufeng Xu
出处
期刊:Soldering & Surface Mount Technology [Emerald Publishing Limited]
卷期号:31 (1): 6-19 被引量:18
标识
DOI:10.1108/ssmt-06-2018-0018
摘要

Purpose This study aims to analyze the shear strength and fracture mechanism of full Cu-Sn IMCs joints with different Cu 3 Sn proportion and joints with the conventional interfacial structure in electronic packaging. Design/methodology/approach The Cu-Sn IMCs joints with different Cu 3 Sn proportion were fabricated through soldering Cu-6 μm Sn-Cu sandwich structure under the extended soldering time and suitable pressure. The joints of conventional interfacial structure were fabricated through soldering Cu-100 μm Sn-Cu sandwich structure. After the shear test was conducted, the fracture mechanism of different joints was studied through observing the cross-sectional fracture morphology and top-view fracture morphology of sheared joints. Findings The strength of joints with the conventional interfacial structure was 26.6 MPa, while the strength of full Cu-Sn IMCs joints with 46.7, 60.6, 76.7 and 100 per cent Cu 3 Sn was, respectively, 33.5, 39.7, 45.7 and 57.9 MPa. The detailed reason for the strength of joints showing such regularity was proposed. For the joint of conventional interfacial structure, the microvoids accumulation fracture happened within the Sn solder. However, for the full Cu-Sn IMCs joint with 46.7 per cent Cu 3 Sn, the cleavage fracture happened within the Cu6Sn5. As the Cu 3 Sn proportion increased to 60.6 per cent, the inter-granular fracture, which resulted in the interfacial delamination of Cu 3 Sn and Cu6Sn5, occurred along the Cu 3 Sn/Cu6Sn5 interface, while the cleavage fracture happened within the Cu6Sn5. Then, with the Cu 3 Sn proportion increasing to 76.7 per cent, the cleavage fracture happened within the Cu6Sn5, while the transgranular fracture happened within the Cu 3 Sn. The inter-granular fracture, which led to the interfacial delamination of Cu 3 Sn and Cu, happened along the Cu/Cu 3 Sn interface. For the full Cu 3 Sn joint, the cleavage fracture happened within the Cu 3 Sn. Originality/value The shear strength and fracture mechanism of full Cu-Sn IMCs joints was systematically studied. A direct comparison regarding the shear strength and fracture mechanism between the full Cu-Sn IMCs joints and joints with the conventional interfacial structure was conducted.
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