记忆电阻器
材料科学
电铸
光电子学
微观结构
纳米技术
可塑性
复合材料
电子工程
工程类
图层(电子)
作者
Xiaobing Yan,Kaiyang Wang,Jianhui Zhao,Zhenyu Zhou,Hong Wang,Jingjuan Wang,Lei Zhang,Xiaoyan Li,Zuoao Xiao,Qianlong Zhao,Yifei Pei,Hong Wang,Cuiya Qin,Hui Li,Jianzhong Lou,Qi Liu,Peng Zhou
出处
期刊:Small
[Wiley]
日期:2019-05-08
卷期号:15 (25)
被引量:156
标识
DOI:10.1002/smll.201900107
摘要
Abstract Two‐dimensional (2D) materials have attracted extensive research interest in academia due to their excellent electrochemical properties and broad application prospects. Among them, 2D transition metal carbides (Ti 3 C 2 T x ) show semiconductor characteristics and are studied widely. However, there are few academic reports on the use of 2D MXene materials as memristors. In this work, reported is a memristor based on MXene Ti 3 C 2 T x flakes. After electroforming, Al/Ti 3 C 2 T x /Pt devices exhibit repeatable resistive switching (RS) behavior. More interestingly, the resistance of this device can be continuously modulated under the pulse sequence with 10 ns pulse width, and the pulse width of 10 ns is much lower than that in other reported work. Moreover, on the nanosecond scale, the transition from short‐term plasticity to long‐term plasticity is achieved. These two properties indicate that this device is favorable for ultrafast biological synapse applications and high‐efficiency training of neural networks. Through the exploration of the microstructure, Ti vacancies and partial oxidation are proposed as the origins of the physical mechanism of RS behavior. This work reveals that 2D MXene Ti 3 C 2 T x flakes have excellent potential for use in memristor devices, which may open the door for more functions and applications.
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