高电子迁移率晶体管
放大器
单片微波集成电路
可靠性(半导体)
电气工程
氮化镓
微波食品加热
极高频率
电力电子
功率(物理)
数码产品
材料科学
电子工程
计算机科学
晶体管
工程类
电压
CMOS芯片
电信
物理
纳米技术
量子力学
图层(电子)
作者
Umesh K. Mishra,Likun Shen,T.E. Kazior,Yifeng Wu
出处
期刊:Proceedings of the IEEE
[Institute of Electrical and Electronics Engineers]
日期:2008-01-16
卷期号:96 (2): 287-305
被引量:1593
标识
DOI:10.1109/jproc.2007.911060
摘要
The rapid development of the RF power electronics requires the introduction of wide bandgap material due to its potential in high output power density, high operation voltage and high input impedance. GaN-based RF power devices have made substantial progresses in the last decade. This paper attempts to review the latest developments of the GaN HEMT technologies, including material growth, processing technologies, device epitaxial structures and MMIC designs, to achieve the state-of-the-art microwave and millimeter-wave performance. The reliability and manufacturing challenges are also discussed.
科研通智能强力驱动
Strongly Powered by AbleSci AI