钝化
材料科学
蚀刻(微加工)
各向同性腐蚀
硫化物
铵
硫黄
载流子寿命
化学工程
分析化学(期刊)
无机化学
核化学
纳米技术
光电子学
图层(电子)
冶金
化学
环境化学
有机化学
工程类
硅
作者
Marie Buffière,Abdel‐Aziz El Mel,Nick Lenaers,Guy Brammertz,Armin E. Zaghi,Marc Meuris,Jef Poortmans
标识
DOI:10.1002/aenm.201401689
摘要
With the aim of developing a safe alternative to the KCN etchant for the removal of Cu x Se secondary phases at the surface of Cu(In,Ga)Se 2 (CIGSe) absorber, a method based on ammonium sulfide (AS) chemical treatment is proposed. Although lower etching rates are observed compared with the KCN reference solution, the AS solution is found to selectively etch Cu x Se phases. In addition, it allows modifying the surface chemical state of the CIGSe absorber by incorporation of sulfur. As a consequence, the minority carrier lifetime located close to the surface of the absorber is found to be improved. Furthermore, it is demonstrated that optimizing the AS treatment time induces a remarkable enhancement in the electrical performances of the CIGSe‐based solar cells.
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