电子束光刻
平版印刷术
纳米
阴极射线
抵抗
镜头(地质)
亮度
光学
场电子发射
纳米技术
物理
电子
材料科学
量子力学
图层(电子)
出处
期刊:Advances in electronics and electron physics
日期:1992-01-01
卷期号:: 107-201
被引量:1
标识
DOI:10.1016/s0065-2539(08)60007-4
摘要
This chapter focuses on electronbeam microlithography. Emphasis is on system design and the various ways of exploiting the interaction between focusing and deflecting fields. A comprehensive comparison of the various approaches is given, as well as a detailed study of the author's own contribution to the field, namely, the swinging objective (immersion) lens. This is a further development in the design philosophy that began with Ohiwa's moving obejctive lens. The work described in this chapter is specifically centered on a detailed experimental and theoretical study of a high-voltage nanometer-scale electron beam lithography system. A system, called Nanowriter, has been designed and constructed to give a large scan field size without compromising the ability to write nanometer-scale structures. Lithography experiments have been carried out to delineate nanometer. A proposal for a future nanometer electron beam system with a high brightness field emission source and swinging objective immersion lens is described.
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