异质结
溅射
氧化铟锡
能量转换效率
材料科学
溅射沉积
退火(玻璃)
电极
光电子学
降级(电信)
太阳能电池
基质(水族馆)
化学工程
薄膜
纳米技术
电子工程
化学
复合材料
海洋学
物理化学
地质学
工程类
作者
Mengxiao Wang,Guanghong Wang,Weibo Gong,Shangzhi Cheng,Lei Zhao,Xiaohua Xu,Daoren Gong,Fei Ye,Liping Mo,Hongwei Diao,Wenjing Wang
标识
DOI:10.1016/j.solmat.2023.112229
摘要
Tin-doped indium oxide (ITO) thin films were prepared at low substrate temperature by direct-current magnetron sputtering technology and applicated as the electrode of silicon heterojunction solar cells (HJT). The chemical, electrical and optical properties of ITO films deposited at different sputtering power are investigated. The optimized ITO films are applied as electrode of HJT solar cells, and the conversion efficiency of more than 25.22% is obtained. In addition, the passivated degradation resulting from ITO deposition is analyzed. The result shows that the degradation is recovered by the annealing process. Finally, the degradation of solar cell efficiency in dark nitrogen environment is tracked. It is found that the solar cells with the highest average conversion efficiency have poor stability, which is mainly attributed to the degradation of the fill factor.
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