比较器
像素
计算机科学
有效位数
逐次逼近ADC
积分器
电子工程
CMOS芯片
奈奎斯特率
量化(信号处理)
探测器
模数转换器
计算机硬件
带宽(计算)
采样(信号处理)
电压
电气工程
人工智能
算法
工程类
电信
作者
Wenxiang Gan,Ruijun Ding,Yun-zhi Ni
摘要
Pixel level on-focal-plane analog to digital conversion(ADC) promises many advantages including high performance and low power consumption. In this paper we argue that CMOS technology scaling will make pixel level ADC increasingly popular. Then we introduce four existing techniques for pixel level ADC. The first is an over sampling technique which uses a one bit first order sigma delta modulator for each pixel to directly convert photo charge to bits, consists of an integrator, a one bit DAC and a clocked comparator. The second technique is Nyquist rate multi-channel-bit-serial(MCBS) ADC. The technique uses special successive comparisons to convert the pixel voltage to bits. The third technique bases on a simple and robust pulse frequency modulation(PFM) scheme that can convert the photocurrent of photodetectors to proportional pulse frequency. The fourth is a software-controlled ADC, which utilize a algorithm, takes a desired photocurrent quantization scale to output bits. Each pixel contains a programmable digital processing element which directly controls the behavior of the photo detector with software. These four techniques are analyzed and compared according to their advantages, disadvantages and suitable application area. Finally we mention our current and future works with one of these techniques.
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