劈理(地质)
半导体
碲化镉光电
半导体材料
化学
结合能
原子物理学
材料科学
物理
纳米技术
光电子学
断裂(地质)
复合材料
作者
M. A. Berding,S. Krishnamurthy,A. Sher,A.-B. Chen
摘要
We present a method for the calculation of the surface and cleavage energies, Eγ, for semiconductors, based on a tight-binding Green’s function approach and a difference-equation solution for the layered structure. Energies are calculated for a representative group of semiconductors, and cleavage energies are found to agree well with the available experimental data. We find ESiγ(111)=1360 ergs/cm2, and Eγ(110)=1000, 180, and 120 ergs/cm2 for GaAs, CdTe, and HgTe, respectively.
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