材料科学
凝聚态物理
单层
扫描透射电子显微镜
各向异性
悬空债券
结晶学
过渡金属
密度泛函理论
纳米技术
透射电子显微镜
硅
化学
物理
光学
计算化学
生物化学
冶金
催化作用
作者
Xiya Chen,Lei Bao,Yong Zhu,Jiadong Zhou,Zheng Liu,Wei Ji,Wu Zhou
出处
期刊:Nanoscale
[Royal Society of Chemistry]
日期:2020-01-01
卷期号:12 (32): 17005-17012
被引量:19
摘要
Rhenium dichalcogenides (ReX2, X = S, Se), as a representative type of T''-phase transition metal dichalcogenides (TMDs), have a distinct anisotropic crystal structure as compared to the well-known H- and T-phases and show excellent optical, electronic and catalytic properties. While edges are known to have a profound influence on the physical and chemical properties of two-dimensional materials, they have not been systematically investigated in T''-phase TMDs. We investigated the pristine edge configurations of ReX2 atomic layers using atomic-resolution scanning transmission electron microscopy (STEM) low-dose imaging and density functional theory (DFT) calculations. The pristine edges in monolayer and bilayer ReX2 can be atomically flat with a length up to several tens of nanometers, and are preferentially oriented along either the a axis or b axis. The characteristic 4Re diamond clusters are well preserved along the edges, and ordered structures of the outermost dangling Se atoms were observed, with the Se atoms fully retained, 50% retained or all lost. The edges oriented along the a axis with 100% Se coverage show a ferromagnetic ground state, while their counterparts parallel to b present mid-gap states without appreciable spin-polarization. The anisotropic T'' structure also dictates the cracking direction in ReX2, with cracks propagating mainly along the a and b axes. The strain at the crack edges often causes re-orientation of the lattice, which would change the anisotropic behavior of ReX2. Our work provides new insights into the edge configuration in T'' TMD atomic layers, and offers new opportunities to tailor the performance of ReX2 by edge engineering.
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