材料科学
压阻效应
CMOS芯片
光电子学
微电子机械系统
光学
硅
物理
作者
Cho-Chuan Tsai,Zhong-He Li,Yu-Tang Lin,Michael S.-C. Lu
出处
期刊:IEEE Sensors Journal
[Institute of Electrical and Electronics Engineers]
日期:2019-09-19
卷期号:20 (1): 242-249
被引量:19
标识
DOI:10.1109/jsen.2019.2942331
摘要
This work presents a biaxial electromagnetically-drivenpiezoresistivelysensed scanning mirror fabricated in a CMOS (complementary metal oxide semiconductor) process. The structure containing the CMOS metal/dielectric layers and underlying silicon is released after backand front-side etch. The drive coil and piezoresistive sensors are implemented by the metal and polysilicon thin films. Biaxial resonances at 1.13 kHz and 41.5 kHz, and an optical angle of 50° for horizontal scan under a drive current of 12.5 mA are measured. Closed-loop control and oscillation for vertical and horizontal scans are also demonstrated for practical applications.
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