Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale

ADVERTISEMENT RETURN TO ISSUEPREVReviewNEXTQuantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device ScaleJonathan Rivnay†, Stefan C. B. Mannsfeld‡, Chad E. Miller‡, Alberto Salleo*†, and Michael F. Toney*‡View Author Information† Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States‡ Stanford Synchrotron Radiation Lightsource (SSRL), SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States*E-mail: [email protected], [email protected]Cite this: Chem. Rev. 2012, 112, 10, 5488–5519Publication Date (Web):August 9, 2012Publication History Received14 March 2012Published online9 August 2012Published inissue 10 October 2012https://pubs.acs.org/doi/10.1021/cr3001109https://doi.org/10.1021/cr3001109review-articleACS PublicationsCopyright © 2012 American Chemical SocietyRequest reuse permissionsArticle Views25021Altmetric-Citations1137LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose SUBJECTS:Organic semiconductors,Physical and chemical processes,Scattering,Thin films,X-rays Get e-Alerts