反射高能电子衍射
电子衍射
单层
气电子衍射
材料科学
二硫化钼
衍射
皮秒
超快电子衍射
选区衍射
超短脉冲
光学
光电子学
纳米技术
物理
激光器
冶金
作者
Calvin Chiu,Thomas S. Liang
出处
期刊:Journal of Student Research
[rScroll]
日期:2023-02-28
卷期号:12 (1)
标识
DOI:10.47611/jsrhs.v12i1.4023
摘要
Reflection high-energy electron diffraction (RHEED) and ultrafast electron diffraction (UED) are techniques used to characterize crystal structures both statically and dynamically. These experimental methods are of academic interest due to their ability to visualize crystal structures on the atomic level and analyze dynamic changes on the picosecond scale. In this experiment, RHEED and UED are implemented to analyze monolayer molybdenum disulfide (MoS2), a compound that may contribute to the future of microelectronics. Images of various diffraction patterns are presented, and analysis is conducted on diffraction peaks, lattice spacing, and photoinduced intensity changes.
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