稳健性(进化)
复制
波形
电压
计算机科学
静电放电
纳秒
可靠性工程
电子线路
电子工程
电气工程
工程类
物理
激光器
生物化学
化学
统计
数学
光学
基因
作者
Lena Zeitlhoefler,Friedrich zur Nieden,Kai Esmark,Reinhold Gaertner
标识
DOI:10.23919/eos/esd54763.2022.9928478
摘要
Standard CDM testing on devices cannot always provide the right information for risk in the field, especially, if the charging voltage level is defined as the gating parameter for robustness. Current waveform parameters such as peak and risetime have to be adjusted to replicate the failure mode at which CCTLP is useful. Device failure on small devices due to sub-nanosecond discharges can also be replicated with discharge electrodes that adapt to special scenarios in production environments.
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