Limitation of CDM Testing for Small Devices

Standard CDM testing on devices cannot always provide the right information for risk in the field, especially, if the charging voltage level is defined as the gating parameter for robustness. Current waveform parameters such as peak and risetime have to be adjusted to replicate the failure mode at which CCTLP is useful. Device failure on small devices due to sub-nanosecond discharges can also be replicated with discharge electrodes that adapt to special scenarios in production environments.