金属间化合物
塞贝克系数
热电效应
电阻率和电导率
热电材料
凝聚态物理
玻尔兹曼方程
材料科学
声子
散射
玻尔兹曼常数
工作(物理)
电子
声子散射
热力学
合金
冶金
物理
量子力学
作者
Ho Ngoc Nam,Katsuhiro Suzuki,Akira Masago,Hikari Shinya,Tetsuya Fukushima,Kazunori Satō
标识
DOI:10.35848/1347-4065/acb97a
摘要
Abstract In this work, we elucidated the electronic structure and thermoelectric properties of intermetallic X Si ( X = Co, Rh) compounds. By combining first-principles calculations and the Boltzmann equation within electron–phonon average approximation, thermoelectric properties of X Si are well reproduced compared to experimental observations. We found that the considerable Seebeck coefficient and low electrical resistivity give X Si a large power factor, which has the potential for thermoelectric applications. We also discussed the electron mean free paths, a possible factor affecting electrical conductivity when using the nanostructuring approach to optimize the thermoelectric performance.
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