Degradation Mechanism of Si Anode in Sulfide-based All-Solid-State Batteries Revealed by Observation of SEI Layer Using 4D-STEM/Super-EDS

Journal Article Degradation Mechanism of Si Anode in Sulfide-based All-Solid-State Batteries Revealed by Observation of SEI Layer Using 4D-STEM/Super-EDS Get access Hyeyoung Cho, Hyeyoung Cho Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South KoreaDivision of Nanoscience and Technology, KIST School, University of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Sangjun Kang, Sangjun Kang Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Kyong-Ryol Tag, Kyong-Ryol Tag Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Hyelin Cho, Hyelin Cho Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Hyun-woo Gong, Hyun-woo Gong Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South KoreaDivision of Nanoscience and Technology, KIST School, University of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Hong-Kyu Kim, Hong-Kyu Kim Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Hae-Ryoung Kim, Hae-Ryoung Kim Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South Korea Search for other works by this author on: Oxford Academic Google Scholar Jae-Pyoung Ahn Jae-Pyoung Ahn Advanced Analysis and Data Center, Korea Institute of Science and Technology, Seoul, South KoreaDivision of Nanoscience and Technology, KIST School, University of Science and Technology, Seoul, South Korea Corresponding author: jpahn@kist.re.kr Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Page 1763, https://doi.org/10.1093/micmic/ozad067.911 Published: 22 July 2023