X-ray topographic study of Bridgman-grown CdZnTeSe

We have characterized the structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot grown by the vertical Bridgman growth technique. The structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot along the length was investigated via X-ray topography in the reflection mode using a white beam synchrotron radiation source. The X-ray topography data revealed the presence of very few sub grain boundaries and no sub-grain boundary network for the CdZnTeSe samples used in this study.