磁阻随机存取存储器
德拉姆
通用存储器
非易失性随机存取存储器
晶体管
可靠性(半导体)
非易失性存储器
材料科学
电气工程
计算机科学
工程物理
半导体存储器
工程类
光电子学
内存刷新
物理
电压
计算机存储器
计算机硬件
功率(物理)
随机存取存储器
量子力学
作者
Denny D. Tang,Chi‐Feng Pai
标识
DOI:10.1002/9781119562269.ch9
摘要
Like metal-oxide-semiconductor field-effect transistors in the silicon industry, magnetic tunnel junctions (MTJs) have become the workhorse of the magnetic recording drive industry since the mid-2000s. A decade afterward, MTJ devices are successfully integrated into silicon chip and have become the highest speed nonvolatile memory the magnetic random-access memory (MRAM) memory. This chapter discusses the MTJ intrinsic properties, which manifest as the MRAM unique attributes; some appear as MRAM strength and others as weakness. It describes the opportunities of MRAM in the memory landscape. The chapter shows how the data nonvolatility property of MRAM improves the overall performance and reliability of the nonvolatile dual-in-line memory module applications. To displace DRAM, one needs to invest in a production facility to scale MRAM as aggressive as DRAM so that the two can compete on the same footing. The chapter also describes the status of MRAM manufacturing, which began in 2006.
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