倒装芯片
空隙(复合材料)
机械工程
小型化
计算机科学
材料科学
毛细管作用
参数统计
炸薯条
可靠性工程
工程类
纳米技术
复合材料
电信
胶粘剂
统计
图层(电子)
数学
作者
Fei Chong Ng,Aizat Abas
出处
期刊:Journal of Electronic Packaging
[ASME International]
日期:2021-04-01
卷期号:144 (1)
被引量:22
摘要
Abstract The scope of review of this paper focused on the precuring underfilling flow stage of encapsulation process. A total of 80 related works has been reviewed and being classified into process type, method employed, and objective attained. Statistically showed that the conventional capillary is the most studied underfill process, while the numerical simulation was mainly adopted. Generally, the analyses on the flow dynamic and distribution of underfill fluids in the bump array aimed for the filling time determination as well as the predictions of void occurrence. Parametric design optimization was subsequently conducted to resolve the productivity issue of long filling time and reliability issue of void occurrence. The bump pitch was found to the most investigated parameter, consistent to the miniaturization demand. To enrich the design versatility and flow visualization aspects, experimental test vehicle was innovated using imitated chip and replacement fluid, or even being scaled-up. Nonetheless, the analytical filling time models became more accurate and sophiscasted over the years, despite still being scarce in number. With the technological advancement on analysis tools and further development of analytic skills, it was believed that the future researches on underfill flow will become more comprehensive, thereby leading to the production of better packages in terms of manufacturing feasibility, performances, and reliability. Finally, few potential future works were recommended, for instance, microscopic analysis on the bump–fluid interaction, consideration of filler particles, and incorporation of artificial intelligence.
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